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2D lithium niobate microstructures: fabrication, characterization, and applications

  Articoli su Riviste JCR/ISI  (anno 2006)

Autori:  Paturzo M., Ferraro P., De Natale P., Finizio A., Mailis S., Gioffrè M., Coppola G., Iodice M

Affiliazione Autori:  CNR - Istituto Nazionale di Ottica Applicata, Via Campi Flegrei 34, 80078 Pozzuoli (NA), Italy; European Laboratory for Non-Linear Istituto di Cibernetica - CNR, Via Campi Flegrei 34, 80078 Pozzuoli (NA), Italy; Istituto per la Microelettronica e i Microsistemi - CNR, Via Pietro Castellino 111, 80131, Napoli, Italy; Optoelectronics Research Centre, Univ. of Southampton, Highfield, SO17 1BJ Southampton UK

Riassunto:  This work concerns the fabrication, optical characterization and potential applications of two types of microstructures manufactured in congruent lithium niobate. The first type consists of a simple 2D hexagonal lattice of inverted ferroelectric domains fabricated by standard electric field poling at room temperature. The second structure is the chemically etched version of the first one. Long etching in hot HF acid results in differential etching of opposite ferroelectric domain faces. In this way obtain a 3D structure is obtained in which the hexagonal domain array becomes an array of truncated pyramids. Both these structures are characterized through a digital interferometric analysis. The samples are inserted in the arm of a Mach-Zenhder interferometer and the digital holograms acquired are used to numerically reconstruct both the amplitude and the phase of the wavefront transmitted by the sample. Finally, we report on the possible applications of the fabricated structures. The hexagonally poled structure can be used as a variable binary phase array. In fact both sides of the poled sample are covered with a thin conductive layer (ITO), which acts as transparent electrode. By applying an external electric field it is possible to change the difference between the two phase levels, via the linear electro-optic effect, and, consequently, the distribution of light intensity in the diffracted orders. On the other hand, the 3D structured etched sample can be used as an micrometer size integral imaging system.

Rivista/Giornale:  PROCEEDINGS OF SPIE
Volume n.:  6185      Pagine da: 61851D  a: 61851D
Ulteriori informazioni:  This research was partially funded by the Ministero dell
DOI: 10.1117/12.664090

   *Citazioni: 1
data tratti da "WEB OF SCIENCE" (marchio registrato di Thomson Reuters) ed aggiornati a:  19/05/2019

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