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Extended focused image in microscopy by digital holography

  Articoli su Riviste JCR/ISI  (anno 2005)

Autori:  Ferraro P., Grilli S., Alfieri D., De Nicola S., Finizio A., Pierattini G., Javidi B., Coppola G., Striano V

Affiliazione Autori:  Istituto Nazionale di Ottica Applicata, Sez. di Napoli, Via Campi Flegrei 34, 80078 Pozzuoli (NA), Italy; Istituto di Cibernetica del CNR, Via Campi Flegrei 34, 80078 Pozzuoli (NA), Italy; University of Connecticut, Electrical and Computer Engineering Dept., 371 Fairfield Road, Unit 2157, Storrs, CT 06269-2157, USA; Istituto di Microelettronica e Microsistemi del CNR, Via P. Castellini 111, 80100, Napoli, Italy

Riassunto:  In microscopy, high magnifications are achievable for investigating micro-objects but the paradigm is that higher is the required magnification, lower is the depth of focus. For an object having a three-dimensional (3D) complex shape only a portion of it appears in good focus to the observer who is essentially looking at a single image plane. Actually, two approaches exist to obtain an extended focused image, both having severe limitations since the first requires mechanical scanning while the other one requires specially designed optics. We demonstrate that an extended focused image of an object can be obtained through digital holography without any mechanical scanning or special optical components. The conceptual novelty of the proposed approach lies in the fact that it is possible to completely exploit the unique feature of DH in extracting all the information content stored in hologram, amplitude and phase, to extend the depth of focus. (c) 2005 Optical Society of America.

Rivista/Giornale:  OPTICS EXPRESS
Volume n.:  13 (18)      Pagine da: 6738  a: 6749
DOI: 10.1364/OPEX.13.006738

*Impact Factor della Rivista: (2005) 3.764   *Citazioni: 192
data tratti da "WEB OF SCIENCE" (marchio registrato di Thomson Reuters) ed aggiornati a:  19/05/2019

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