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Coherent imaging by digital holographic microscopy: focusing capabilities and depth of focus in the reconstructed images

  Articoli su Riviste JCR/ISI  (anno 2005)

Autori:  Ferraro P., Grilli S., Alfieri D., De Nicola S., Finizio A., Pierattini G., Javidi B., Coppola G., Striano V

Affiliazione Autori:  Istituto Nazionale di Ottica Applicata, Sez. di Napoli, Via Campi Flegrei 34, 80078 Pozzuoli (NA), Italy; Istituto di Cibernetica del CNR, Via Campi Flegrei 34, 80078 Pozzuoli (NA), Italy; Istituto di Microelettronica e Microsistemi del CNR, Via P. Castellin1 111, 80100, Napoli, Italy; University of Connecticut, Electrical & Computer Engineering Dept. 371 Fairfield Roar, Unit 2157, Storrs, CT 06269-2157, USA

Riassunto:  Observing at a microscope object having a three-dimensional (3D) complex shape only a portion of it appears in focus since essentially a single image plane is imaged. Up to now only two approaches have been developed to obtain an extended focused image (EFI). An EFI shows all details of the object in focus. Both methods having severe limitations since one requires mechanical scanning while the other needs specially designed optics. We demonstrate that an EFI image of an object can be obtained by means of digital holography (DH) in a microscope configuration overcoming the mentioned limitations. The novelty of the proposed approach lies in the fact that it is possible to build an EFI by exploiting the unique feature of DH in extracting all the information content stored in hologram (phase and amplitude).

Rivista/Giornale:  PROCEEDINGS OF SPIE
Volume n.:  5908      Pagine da: 590803-1  a: 590803-10
Note:  Congress: Optical Information Systems III in San Diego (USA)


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