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Interferometric measurement of thermal expansion coefficients and thermo-optic coefficients in ferroelectric crystals

  Articoli su Riviste JCR/ISI  (anno 2006)

Autori:  Pignatiello F., De Rosa M., Ferraro P., Arie A., Grilli S., Sansone L., De Nicola S., De Natale P

Affiliazione Autori:  Istituto Nazionale di Ottica Applicata, Sez. di Napoli, Via Campi Flegrei 34, 80078 Pozzuoli (NA), Italy; Department of Physical Electronics, School Electrical Engineering, Faculty of Engineering, Tel Aviv University, 69978 Tel Aviv, Israel; CNR Istituto di Cibernetica "E. Caianiello", Via Campi Flegrei 34, 80078 Pozzuoli (NA), Italy

Riassunto:  We demonstrate a dual interferometric technique for simultaneous and independent measurements of the temperature dependence of the thermo-optic and thermal expansion coefficients in ferroelectric crystals. The crystal temperature can be changed from room temperature up to about 200 degrees C by an actively stabilized heater (stability < 0.1 degrees C). The thermal expansion coefficient is determined using a moire interferometer and monitoring the period of a grating written on the z-face of the crystal sample as a function of the temperature of the crystal. The thermo-optic coefficients of both ordinary an extraordinary axes are estimated by measuring the optical path variation measured by a Mach-Zehnder interferometer with one arm passing through the crystal perpendicularly to the crystal z-axis. This method can be applied to a wide variety of optical materials, when an accurate knowledge of the temperature dependence of the refractive index and thermal expansion is needed.

Rivista/Giornale:  PROCEEDINGS OF SPIE
Volume n.:  6188      Pagine da: 61880O  a: 61880O
Note:  Congress: Optical Micro- and Nanometrology in Microsystems Technology in Strasburgo (Francia)
DOI: 10.1117/12.664037


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