vai_a_storia   vai_a_organizzazione   vai_a_sedi   vai_a_personale   Area Riservata
    English English Version  

Pin-hole array production and detailed data analysis for advanced single-shot X-ray imaging of laboratory plasmas

  Articoli su Riviste JCR/ISI  (anno 2010)

Autori:  Levato, T. Labate, L., Pathak N. C., Cecchetti C., Koester P., Di Fabrizio E., Delogu P., Giulietti A., GiulietTi D., Gizzi LPathak N. C., Cecchetti C., Koester P., Di Fabrizio E., Delogu P., Giulietti A., Giulietti D., Gizzi LA

Affiliazione Autori:  FLAME, Laboratori Nazionali di Frascati (LNF), Via E. Fermi 40, 00044 Frascati, Italy; ILIL, Consiglio Nazionale delle Ricerche (CNR), Pisa, Italy; BIONEM, Campus Magna Graecia University of Catanzaro (UMG), Italy; University of Pisa, Department of Physics, Italy

Riassunto:  Laser produced plasmas offer the unique opportunity to investigate physical mechanisms working at extremely high field in pulsed regime [1] (Gizzi et al., 2009). Future large scale infrastructure like HiPER and ELI may open new frontiers of knowledge in this way. Technologies needed for improving diagnostic in this field have a strong impact on a wide range of multi-disciplinary applications as for compact plasma-based accelerators [1,2] (Gizzi et al., 2009; Betti et al., 2009) laser fusion oriented experiments, three-dimensional microscopy and lithography. As an example the X-ray imaging, being a powerful diagnostic tool for deep investigation on different variety of laser produced plasma, has obtained a grooving effort in recent years. Large scale facilities working in single-pulse regime for laser fusion oriented experiments have evidenced the necessity to obtain spectrally resolved X-ray images of produced plasmas in a single shot. By combining the charge coupled devices (CCD) based single-photon detection technique with a pin-hole array (PHA) a new diagnostic technique was developed, as shown in recent experiments related to the European HiPER project [3] (Labate et al., 2009). Here we qualitatively describe the PHA production process on a heavy metal substrate by means of SEM images that show an internal diameter on the micrometer scale and an aspect ratio of about 20. The characterization of the X-ray contrast up to 90 keV is presented. The data analysis of the X-ray photons interaction on CCD, for spectrum reconstruction up to high energy, is described [4] (Levato et al., 2008). (C) 2010 Elsevier B.V. All rights reserved.

Volume n.:  623 (2)      Pagine da: 842  a: 844
Ulteriori informazioni:  Proceedings Paper: 1st International Conference on Frontiers in Diagnostic Technologies, Frascati, ITALY, NOV 25-29, 2009
DOI: 10.1016/j.nima.2010.02.082

*Impact Factor della Rivista: (2010) 1.142   *Citazioni: 3
data tratti da "WEB OF SCIENCE" (marchio registrato di Thomson Reuters) ed aggiornati a:  19/05/2019

Riferimenti visionabili in IsiWeb of Knowledge: (solo per sottoscrittori)
Per visualizzare la scheda dell'articolo su IsiWeb: Clicca qui
Per visualizzare la scheda delle Citazioni dell'articolo su IsiWeb: Clicca qui

INO © Istituto Nazionale di Ottica - Largo Fermi 6, 50125 Firenze | Tel. 05523081 Fax 0552337755 - P.IVA 02118311006     P.E.C.    Info