INO
CNR
vai_a_storia   vai_a_organizzazione   vai_a_sedi   vai_a_personale   Area Riservata
    English English Version  
 
 

Spectral characterization of two-dimensional Thue-Morse quasicrystals realized with high resolution lithography

  Articoli su Riviste JCR/ISI  (anno 2011)

Autori:  Matarazzo V., De Nicola S., Zito G., Mormile P., Rippa M., Abbate G., Zhou J., Petti L

Affiliazione Autori:  CNR - Istituto di Cibernetica ‘E Caianiello’, Via Campi Flegrei 34, 80078 Pozzuoli (Na), Italy; CNR - Istituto Nazionale di Ottica, Via Campi Flegrei 34,80078 Pozzuoli (Na), Italy; CNR-SPIN and Physics Department, University of Naples ‘Federico II’, I-80126 Naples, Italy; Photonics Institute of the University of Ningbo City, Zhejiang Province, People’s Republic of China

Riassunto:  One-dimensional Thue-Morse (ThMo) lattices are examples of self-similar structures that exhibit bandgap phenomena. ThMo multilayers may also possess fractal photonic bandgaps that give rise to large omnidirectional reflectance and light-emission enhancement effects. Two-dimensional (2D) ThMo aperiodic quasicrystals possess interesting properties for photonic applications too. Here we demonstrate the experimental fabrication of large area 2D ThMo lattices into polymeric substrates at nanometre scale by electron beam lithography (EBL). Far field diffraction patterns of the experimental ThMo structures have been measured and compared with the calculated theoretical Fourier spectra. Scanning electron microscopy and far field diffraction are used to characterize the experimental structures.

Rivista/Giornale:  JOURNAL OF OPTICS
Volume n.:  13 (1)      Pagine da: 015602  a: 015602
DOI: 10.1088/2040-8978/13/1/015602

*Impact Factor della Rivista: (2011) 1.924   *Citazioni: 15
data tratti da "WEB OF SCIENCE" (marchio registrato di Thomson Reuters) ed aggiornati a:  21/07/2019

Riferimenti visionabili in IsiWeb of Knowledge: (solo per sottoscrittori)
Per visualizzare la scheda dell'articolo su IsiWeb: Clicca qui
Per visualizzare la scheda delle Citazioni dell'articolo su IsiWeb: Clicca qui

INO © Istituto Nazionale di Ottica - Largo Fermi 6, 50125 Firenze | Tel. 05523081 Fax 0552337755 - P.IVA 02118311006     P.E.C.    Info