vai_a_storia   vai_a_organizzazione   vai_a_sedi   vai_a_personale   Area Riservata
    English English Version  

Method for high-resolution frequency measurements in the extreme ultraviolet regime: Random-sampling Ramsey spectroscopy

  Articoli su Riviste JCR/ISI  (anno 2011)

Autori:  Eramo R., Cavalieri S., Corsi C., Liontos I., Bellini M

Affiliazione Autori:  CNR - Istituto Nazionale di Ottica, L.go E. Fermi 6, 50125 Florence, Italy; European Laboratory for non linear Spectroscopy (LENS), 50019 Sesto Fiorentino, Florence, Italy; Department of Physics, University of Florence, 50019 Sesto Fiorentino, Florence, Italy

Riassunto:  Ramsey-like schemes have been recently introduced in combination with high-order laser harmonic sources for high-resolution spectroscopic studies in the extreme ultraviolet (XUV). Here we demonstrate a novel method, combining measurements only in a limited subset of randomly chosen time-sampling intervals, which lead us to perform the first high-resolution XUV spectroscopy of atomic argon with a simple split-pulse setup. Providing an experimentally simple and convenient solution to the problem of performing high-resolution absolute frequency measurements in the XUV, our approach will help paving new roads into this challenging spectral territory.

Volume n.:  106 (21)      Pagine da: 213003  a: 213003
Ulteriori informazioni:  This work was partially supported by Ente Cassa di Risparmio di Firenze, by the EC\'s FP7 under grant agreement No. 228334 (JRA1: ALADIN), and by Regione Toscana under project CTOTUS. We acknowledge R. Ballerini and A. Hajeb for the accurate mechanical realizations, and M. Giuntini, M. De Pas, and A. Montori for assistance in the setup of the electronics.
DOI: 10.1103/PhysRevLett.106.213003

*Impact Factor della Rivista: (2011) 7.370   *Citazioni: 9
data tratti da "WEB OF SCIENCE" (marchio registrato di Thomson Reuters) ed aggiornati a:  19/05/2019

Riferimenti visionabili in IsiWeb of Knowledge: (solo per sottoscrittori)
Per visualizzare la scheda dell'articolo su IsiWeb: Clicca qui
Per visualizzare la scheda delle Citazioni dell'articolo su IsiWeb: Clicca qui

INO © Istituto Nazionale di Ottica - Largo Fermi 6, 50125 Firenze | Tel. 05523081 Fax 0552337755 - P.IVA 02118311006     P.E.C.    Info