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Fractal characteristics of far-field diffraction patterns for two-dimensional Thue-Morse quasicrystals

  Articoli su Riviste NON JCR/ISI  (anno 2011)

Autori:  Yang M-y., Zhou J., Petti L., De Nicola S., Mormile P

Affiliazione Autori:  Institute of Photonics, Faculty of Science, Ningbo University, Ningbo 315211, China; Istituto di Cibernetica “E. Caianiello” del Consiglio Nazionale delle Ricerche, Via Campi Flegrei 34, Pozzuoli (Na) 80078, Italy; Istituto Nazionale di Ottica del Consiglio Nazionale delle Ricerche, Via Campi Flegrei 34, Pozzuoli (Na) 80078, Italy

Riassunto:  We report a numerical method to analyze the fractal characteristics of far-field diffraction patterns for two-dimensional Thue-Morse (2-D TM) structures. The far-field diffraction patterns of the 2-D TM structures can be obtained by the numerical method, and they have a good agreement with the experimental ones. The analysis shows that the fractal characteristics of far-field diffraction patterns for the 2-D TM structures are determined by the inflation rule, which have potential applications in the design of optical diffraction devices.

Rivista/Giornale NON ISI:  Optoelectronics Letters
Volume n.:  7 (5)      Pagine da: 346  a: 349
DOI: 10.1007/s11801-011-1057-0

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