INO
CNR
vai_a_storia   vai_a_organizzazione   vai_a_sedi   vai_a_personale   Area Riservata
    English English Version  
 
 

Stoichiometry Gradient, Cation Interdiffusion, and Band Alignment between a Nanosized TiO2 Blocking Layer and a Transparent Conductive Oxide in Dye-Sensitized Solar Cell Front Contacts

  Articoli su Riviste JCR/ISI  (anno 2015)

Autori:  Salvinelli G., Drera G., Baratto C., Braga A., Sangaletti L

Affiliazione Autori:  Interdisciplinary Laboratories for Advanced Materials Physics (I-LAMP) and Dipartimento di Matematica e Fisica, Università Cattolica del Sacro Cuore, I-25121 Brescia, Italy; CNR INO Sensor Lab, Via Branze 45, 25133 Brescia, Italy; University of Brescia, Dept. of Information Engineering, Via Valotti 9, 25133 Brescia, Italy

Riassunto:  An angle-resolved photoemission spectroscopy study allowed us to identify cation interdiffusion and stoichiometry gradients at the interface between a nanosized TiO2 blocking layer and a transparent conductive Cd-Sn oxide substrate. A stoichiometry gradient for the Sn cations is already found in the bare Cd-Sn oxide layer. When TiO2 ultrathin layers are deposited by RF sputtering on the Cd-Sn oxide layer, Ti is found to partially replace Sn, resulting in a Cd-Sn-Ti mixed oxide layer with a thickness ranging from 0.85 to 3.3 nm. The band gap profile across the junction has been reconstructed for three TiO2 layers, resulting in a valence band offset decrease (and a conduction band offset increase) with the blocking layer thickness. The results are related to the cell efficiencies in terms of charge injection and recombination processes.

Rivista/Giornale:  ACS APPLIED MATERIALS & INTERFACES
Volume n.:  7 (1)      Pagine da: 765  a: 773
DOI: 10.1021/am5072018

*Impact Factor della Rivista: (2015) 7.145   *Citazioni: 5
data tratti da "WEB OF SCIENCE" (marchio registrato di Thomson Reuters) ed aggiornati a:  19/05/2019

Riferimenti visionabili in IsiWeb of Knowledge: (solo per sottoscrittori)
Per visualizzare la scheda dell'articolo su IsiWeb: Clicca qui
Per visualizzare la scheda delle Citazioni dell'articolo su IsiWeb: Clicca qui

INO © Istituto Nazionale di Ottica - Largo Fermi 6, 50125 Firenze | Tel. 05523081 Fax 0552337755 - P.IVA 02118311006     P.E.C.    Info