vai_a_storia   vai_a_organizzazione   vai_a_sedi   vai_a_personale   Area Riservata
    English English Version  

LESM: a laser-driven sub-MeV electron source delivering ultra-high dose rate on thin biological samples

  Articoli su Riviste JCR/ISI  (anno 2016)

Autori:  Labate L., Andreassi MG., Baffigi F., Bizzarri R., Borghini A., Bussolino GC., Fulgentini L., Ghetti F., Giulietti A., Koster P., Lamia D., Levato T., Oishi Y., Pulignani S., Russo G., Sgarbossa A., Gizzi LA

Affiliazione Autori:  Istituto Nazionale di Ottica, Consiglio Nazionale delle Ricerche, Pisa, Italy Istituto di Fisiologia Clinica, Consiglio Nazionale delle Ricerche, Pisa, Italy NEST, Istituto Nanoscienze, Consiglio Nazionale delle Ricerche and Scuola Normale Superiore, Pisa, Italy Istituto di Bioimmagini e Fisiologia Molecolare, Consiglio Nazionale delle RicercheŚLATO, Cefal¨, Italy ELI-Beamlines, Institute of Physics of the Czech Academy of Science, Prague, Czech Republic Central Research Institute of Electric Power Industry, Kanagawa, Japan

Riassunto:  We present a laser-driven source of electron bunches with average energy 260 keV and picosecond duration, which has been setup for radiobiological tests covering the previously untested sub-MeV energy range. Each bunch combines high charge with short duration and sub-millimeter range into a record instantaneous dose rate, as high as 10(9) Gy s(-1). The source can be operated at 10 Hz and its average dose rate is 35 mGy s(-1). Both the high instantaneous dose rate and high level of relative biological effectiveness, attached to sub-MeV electrons, make this source very attractive for studies of ultrafast radiobiology on thin cell samples. The source reliability, in terms of shot-to-shot stability of features such as mean energy, bunch charge and transverse beam profile, is discussed, along with a dosimetric characterization. Finally, a few preliminary biological tests performed with this source are presented.

Volume n.:  49 (27)      Pagine da: 275401-1  a: 275401-9
Collegamento Web del Prodotto: Clicca qui

*Impact Factor della Rivista: (2016) 2.588   *Citazioni: 1
data tratti da "WEB OF SCIENCE" (marchio registrato di Thomson Reuters) ed aggiornati a:  19/05/2019

INO © Istituto Nazionale di Ottica - Largo Fermi 6, 50125 Firenze | Tel. 05523081 Fax 0552337755 - P.IVA 02118311006     P.E.C.    Info