vai_a_storia   vai_a_organizzazione   vai_a_sedi   vai_a_personale   Area Riservata
    English English Version  

Optical characterization of antirelaxation coatings for photonics applications

  Articoli su Riviste JCR/ISI  (anno 2016)

Autori:  Tsvetkov S., Gateva S., Nasyrov K., Gozzini S., Mariotti E., Cartaleva S

Affiliazione Autori:  Institute of Electronics, Bulgarian Academy of Sciences,72 Tzarigradsko Chaussee, 1784 Sofia, Bulgaria Institute of Automation and Electrometry SB RAS, Novosibirsk, Russia Istituto Nazionale di Ottica del CNR – UOS Pisa, Via Moruzzi 1, 56124 Pisa, Italy DSFTA, Università di Siena, Via Roma 56, 53100 Siena, Italy

Riassunto:  Optical characterization of antirelaxation coatings with regard to their applications in coherent spectroscopy and LIAD experiments is presented. A simple method, based on the recording of the fluorescence intensity of the Rb alkali atoms during resonant light pulse irradiation is used for comparison of the antirelaxation properties of the coatings. The LIAD yield and dynamics are measured by registration of the 780 nm Rb line transmission. The comparison of the parameters of PDMS coatings prepared with two different solutions in ether (PDMS 2% and PDMS 5%) shows that when illuminating with such LED intensity at which the LIAD efficiency is equal in the two cells, the light induced Rb vapor density changes are about an order of magnitude slower in the PDMS 2% cell, and the antirelaxation properties of the two cells are equal.

Volume n.:  48      Pagine da: 173  a: 177

*Impact Factor della Rivista: (2016) 0.238
data tratti da "WEB OF SCIENCE" (marchio registrato di Thomson Reuters) ed aggiornati a:  14/07/2019

INO © Istituto Nazionale di Ottica - Largo Fermi 6, 50125 Firenze | Tel. 05523081 Fax 0552337755 - P.IVA 02118311006     P.E.C.    Info