INO
CNR
vai_a_storia   vai_a_organizzazione   vai_a_sedi   vai_a_personale   Area Riservata
    English English Version  
 
 

Subsurface imaging of two-dimensional materials on the nanoscale

  Articoli su Riviste JCR/ISI  (anno 2017)

Autori:  Dinelli F., Pingue P., Kay N.D., Kolosov O

Affiliazione Autori:  1. CNR, Istituto Nazionale di Ottica (INO), via Moruzzi 1, 56124 Pisa, Italy 2. Laboratorio NEST - Scuola Normale Superiore, and Istituto Nanoscienze - CNR, Piazza San Silvestro 12, I-56127 Pisa, Italy 3. Physics Department, Lancaster University, Lancaster, LA1 4YB, UK

Riassunto:  Scanning probe Microscopy (SPM) represents a powerful tool that, in the past thirty years, has allowed one to investigate material surfaces in unprecedented ways at the nanoscale level. However, SPM has shown very little power of depth penetration, whereas several nanotechnology applications would require it. Subsurface imaging has been achieved only in a few cases, when subsurface features influence the physical properties of the surface, such as the electronic states or the heat transfer. Ultrasonic Force Microscopy (UFM), an adaption of the contact mode Atomic Force Microscopy (AFM), can dynamically measure the stiffness of the elastic contact between the probing tip and the sample surface. In particular, UFM has proven highly sensitive to the near surface elastic field in non-homogeneous samples. In this paper, we present an investigation of two-dimensional (2D) materials, namely flakes of graphite and molybdenum disulphide placed on structured polymeric substrates. We show that UFM can non-destructively distinguish suspended and supported areas and localize defects, such as buckling or delamination of adjacent monolayers, generated by residual stress. Specifically, UFM can probe small variations in the local indentation induced by the mechanical interaction between the tip and the sample. Therefore, any change in the elastic modulus within the volume perturbed by the applied load or the flexural bending of the suspended areas can be detected and imaged. These capabilities of investigation are very promising in order to study the buried interfaces of nanostructured 2D materials such as in graphene-based devices.

Rivista/Giornale:  NANOTECHNOLOGY
Volume n.:  28      Pagine da: 085706  a: 085713
DOI: 10.1088/1361-6528/aa55e2

*Impact Factor della Rivista: (2017) 3.404   *Citazioni: 6
data tratti da "WEB OF SCIENCE" (marchio registrato di Thomson Reuters) ed aggiornati a:  19/05/2019

INO © Istituto Nazionale di Ottica - Largo Fermi 6, 50125 Firenze | Tel. 05523081 Fax 0552337755 - P.IVA 02118311006     P.E.C.    Info